COM8136CD

Clock Generators, PLLs, Frequency Synthesizers SMSC COM8136CD Overview

The SMSC COM8136CD Dual Baud Rate Generator is a sophisticated and essential component for systems requiring precise clock generation and frequency synthesis. Designed by SMSC, this integrated circuit is engineered to provide reliable, dual-channel baud rate generation which is critical for advanced communication systems. It is particularly adept at handling multiple frequencies and complex timing requirements, making it an ideal choice for designers looking to improve communication efficiency and data integrity. The keyword 'Clock Generators, PLLs, Frequency Synthesizers SMSC COM8136CD' encapsulates a solution tailored for applications demanding high precision and versatility in frequency management.

COM8136CD Features

The COM8136CD boasts several key features that make it stand out in the field of clock generators, PLLs, and frequency synthesizers. These include dual baud rate generation capabilities, wide operational temperature range, and low power consumption. Additionally, it offers compatibility with various microprocessors, providing flexibility in system design and integration. Its robust design ensures long-term reliability and performance under diverse conditions.

COM8136CD Applications

• Telecommunications Equipment: The COM8136CD is used to generate precise baud rates required for modems, routers, and switches, ensuring efficient and stable data transmission.
• Embedded Systems: This IC can serve as a critical component in embedded systems, providing the necessary clock management for microcontroller-based applications, ensuring timely and accurate operations.
• Networking Hardware: Utilized in network hubs, bridges, and gateways, the COM8136CD aids in handling synchronous data streams that require stable and accurate clock outputs for optimal performance.
• Consumer Electronics: In consumer electronics such as set-top boxes and smart TVs, the IC helps manage data flow rates, enhancing user experience through improved device response and reliability.